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Study of the kink effect in AlInAs/GaInAs/InP composite ... - Springer
WebLDTS. Long Distance Travel Survey (UK) LDTS. Laser Designator Tracker System. LDTS. Laser Designator Targeting System. LDTS. Low Density Test Signal. WebCurrent Transient Spectroscopy (CTS) Detects and amplifies current transients. Useful for characterizing samples with vanishingly small variations in capacitance (such as semi … mandarin oriental new york suite 5000
Correlation between trap characterization by drain conductance ...
Deep Level Transient Spectroscopy (DLTS) is considered to be a great tool for characterizing electrically active majority carrier traps in semiconductors [1]. The fundamental principle of DLTS comprises of measuring the capacitance of an ideal junction such as a reverse-biased Schottky diode, while filling … See more A description of the setup used to carry out the DLTS and L-DLTS characterization is provided in Figure 1. The capacitance was measured in a 4-terminal configuration using the MFIA in the 3 V and 1 mA voltage … See more DLTS and L-DLTS spectra have been measured on a setup based on a Zurich Instruments MFIA impedance analyzer,and compared to a system using a Boonton 7200 capacitance meter in its highest resolution … See more WebThe DLTS spectra measured from the EPV sample with a reverse bias voltage, V R =-0.1V, a trap-filling pulse of 0.3 V, and a saturation pulse width of 10 ms is shown in Fig. 2. The EPV sample showed a deep majority carrier trap (negative signal) at a temperature around 270 K. The DLTS peak shifts to higher temperatures with shorter rate windows. kooy occasions